Investigation on the Breakdown Strength of Aged Special Layered Silicone Dielectrics under DC Stress

verfasst von

Mirnes Aganbegovic, Peter Werle

Abstract

In polymeric insulations space charges tend to form under DC voltage stress. Consequently, at a polarity reversal of the voltage, the electric field is intensified locally, which accelerates the aging of the insulation and can lead to the destruction of the insulating material in the worst case. The aim of this work is to investigate the aging of special layered silicone dielectrics under DC voltage stress. Two-layered silicone samples were made, one layer without fillers and the other made of the same silicone, mixed with a specific amount of conductive additive. Thus, the layers have different electric conductivities, which are dependent on the temperature and the electric field strength. First of all, the life span of the silicone stack under DC was investigated. Since there is no standard, how to accomplish this under DC, the life span was determined according to AC. The aging of the samples was carried out thermally with and without DC voltage stress for 15 weeks. The breakdown test was conducted after every three weeks using a ramp-test.

Organisationseinheit(en)

Fachgebiet Hochspannungstechnik und Asset Management (Schering-Institut)
Institut für Elektrische Energiesysteme

Typ

Aufsatz in Konferenzband

Seiten

706-709

Anzahl der Seiten

4

Publikationsdatum

10.2019

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Elektronische, optische und magnetische Materialien, Elektrotechnik und Elektronik

Elektronische Version(en)

https://doi.org/10.1109/CEIDP47102.2019.9009661 (Zugang: Geschlossen)