Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications

Authored by

Peter Werle, Hassan Saadati, J. M. Seifert

Details

Organisation(s)
High Voltage Engineering and Asset Management Section (Schering Institute)
External Organisation(s)
Pfisterer/ LAPP Insulators GmbH
Type
Paper
Publication date
2018
Publication status
Published