Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications

authored by

Peter Werle, Hassan Saadati, J. M. Seifert

Organisation(s)

High Voltage Engineering and Asset Management Section (Schering Institute)

External Organisation(s)

Pfisterer/ LAPP Insulators GmbH

Type

Paper

Publication date

2018

Publication status

Published