Circuit breaker life assessment based on the defect statistics and cost analysis

authored by

Kai Gao, Zhaolin Liu, Linghui Yang, X. Zhang, Ernst Gockenbach

Organisation(s)

High Voltage Engineering and Asset Management Section (Schering Institute)

External Organisation(s)

East China Grid (ECGC)
East China Electrical Test and Research Institute

Type

Paper

Publication date

2011

Publication status

Published

Peer reviewed

Yes