Circuit breaker life assessment based on the defect statistics and cost analysis

Authored by

Kai Gao, Zhaolin Liu, Linghui Yang, X. Zhang, Ernst Gockenbach

Details

Organisation(s)
High Voltage Engineering and Asset Management Section (Schering Institute)
External Organisation(s)
East China Grid (ECGC)
East China Electrical Test and Research Institute
Type
Paper
Publication date
2011
Publication status
Published
Peer reviewed
Yes